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Multiscale modeling of effects due to impurity clustering in semiconductor systems
URI:
http://urn.fi/URN:NBN:fi:bib:me:W00518166800
author
Hynninen, Teemu
contributor
Teknillinen korkeakoulu. Teknillisen fysiikan laitos
inLanguage
en
isPartOf
Fennica
name
Multiscale modeling of effects due to impurity clustering in semiconductor systems
P60049
<http://rdaregistry.info/termList/RDAContentType/1020>
Instances
-
2008 : Teknillinen korkeakoulu
Multiscale modeling of effects due to impurity clustering in semiconductor systems
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00518166801
description
Myös verkkoaineistona ISBN 978-951-22-9682-8 (PDF)
isPartOf
Fennica
TKK Dissertation
name
Multiscale modeling of effects due to impurity clustering in semiconductor systems
View this in Finna
Multiscale modeling of effects due to impurity clustering in semiconductor systems
URI:
http://urn.fi/URN:NBN:fi:bib:me:I00518166800
datePublished
2008
description
Artikkeliväitöskirjan yhteenveto-osa ja 7 eripainosta.
kuvitettu
identifier
propertyID:
FI-FENNI
value:
903442
propertyID:
FI-MELINDA
value:
005181668
propertyID:
skl
value:
fx903442
isbn
9789512296811
isPartOf
Fennica
TKK Dissertation
name
Multiscale modeling of effects due to impurity clustering in semiconductor systems
numberOfPages
xi, 50, [69] sivu
P60048
<http://rdaregistry.info/termList/RDACarrierType/1049>
P60050
<http://rdaregistry.info/termList/RDAMediaType/1007>
publication
location:
Espoo
organizer:
Teknillinen korkeakoulu
publisher
Teknillinen korkeakoulu
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