National Library of Finland
Open Data and Linked Data Service
Search works, persons, organizations and subjects:
Material characterization and fabrication of compound semiconductor X-ray detectors
URI:
http://urn.fi/URN:NBN:fi:bib:me:W01088101700
about
kiteet
mittausmenetelmät
puolijohteet
virheet
author
Kostamo, Pasi
inLanguage
en
isPartOf
Fennica
name
Material characterization and fabrication of compound semiconductor X-ray detectors
P60049
<http://rdaregistry.info/termList/RDAContentType/1020>
Instances
-
-
-
-
-, e-book
2017 : Aalto-yliopisto
2017 : Aalto-yliopisto, e-book
Material characterization and fabrication of compound semiconductor X-ray detectors
URI:
http://urn.fi/URN:NBN:fi:bib:me:I01088101702
isbn
9789526073453
isPartOf
Fennica
Julk. - Turun yliop., Poliittinen hist., E
name
Material characterization and fabrication of compound semiconductor X-ray detectors
Material characterization and fabrication of compound semiconductor X-ray detectors
URI:
http://urn.fi/URN:NBN:fi:bib:me:I01111539301
description
Yhteenveto-osa julkaistu myös verkkoaineistona
isPartOf
Fennica
Julk. - Turun yliop., Poliittinen hist., E
name
Material characterization and fabrication of compound semiconductor X-ray detectors
Material characterization and fabrication of compound semiconductor X-ray detectors
URI:
http://urn.fi/URN:NBN:fi:bib:me:I01111539302
isbn
9789526073446
isPartOf
Fennica
Julk. - Turun yliop., Poliittinen hist., E
name
Material characterization and fabrication of compound semiconductor X-ray detectors
Material characterization and fabrication of compound semiconductor X-ray detectors
URI:
http://urn.fi/URN:NBN:fi:bib:me:I01088101701
description
Julkaistu myös painettuna
isPartOf
Fennica
Julk. - Turun yliop., Poliittinen hist., E
name
Material characterization and fabrication of compound semiconductor X-ray detectors
Material characterization and fabrication of compound semiconductor X-ray detectors
URI:
http://urn.fi/URN:NBN:fi:bib:me:I01111539303
bookFormat
<http://schema.org/EBook>
isPartOf
Fennica
Julk. - Turun yliop., Poliittinen hist., E
name
Material characterization and fabrication of compound semiconductor X-ray detectors
url
<http://urn.fi/URN:ISBN:978-952-60-7344-6>
Material characterization and fabrication of compound semiconductor X-ray detectors
URI:
http://urn.fi/URN:NBN:fi:bib:me:I01111539300
datePublished
2017
description
Artikkeliväitöskirjan yhteenveto-osa ja 9 eripainosta.
kuvitettu
identifier
propertyID:
FI-MELINDA
value:
011115393
isbn
9789526073453
isPartOf
Fennica
Julk. - Turun yliop., Poliittinen hist., E
name
Material characterization and fabrication of compound semiconductor X-ray detectors
numberOfPages
xiv, 59 sivua, 47 sivua useina numerointijaksoina
P60048
<http://rdaregistry.info/termList/RDACarrierType/1048>
<http://rdaregistry.info/termList/RDACarrierType/1049>
P60050
<http://rdaregistry.info/termList/RDAMediaType/1007>
publication
location:
Helsinki
organizer:
Aalto-yliopisto
publisher
Aalto-yliopisto
Material characterization and fabrication of compound semiconductor X-ray detectors
URI:
http://urn.fi/URN:NBN:fi:bib:me:I01088101700
bookFormat
<http://schema.org/EBook>
datePublished
2017
description
Artikkeliväitöskirjan yhteenveto-osa.
kuvitettu
identifier
propertyID:
FI-MELINDA
value:
010881017
isbn
9789526073446
isPartOf
Fennica
Julk. - Turun yliop., Poliittinen hist., E
name
Material characterization and fabrication of compound semiconductor X-ray detectors
numberOfPages
1 verkkoaineisto (79 sivua)
P60048
<http://rdaregistry.info/termList/RDACarrierType/1018>
P60050
<http://rdaregistry.info/termList/RDAMediaType/1003>
publication
location:
Helsinki
organizer:
Aalto-yliopisto
publisher
Aalto-yliopisto
url
Download this resource as RDF:
Turtle
RDF/XML
N-Triples
JSON-LD