Demonstration of the enhanced Purcell factor in all-dielectric structures

The Purcell effect is usually described as a modification of the spontaneous decay rate in the presence of a resonator. In plasmonics, this effect is commonly associated with a large local-field enhancement in "hot spots" due to the excitation of surface plasmons. However, high-index dielectric nanostructures, which become the basis of all-dielectric nanophotonics, cannot provide high values of the local-field enhancement due to larger radiation losses. Here, we demonstrate how to achieve a strong Purcell effect in all-dielectric nanostructures, and show theoretically that the Purcell factor can be increased by two orders of magnitude in a finite chain of silicon nanoparticles. Using the eigenmode analysis for an infinite chain, we demonstrate that the high Purcell factor regime is associated with a Van Hove singularity. We perform a proof-of-concept experiment for microwave frequencies and observe the 65-fold enhancement of the Purcell factor in a chain of 10 dielectric particles.

DOI

10.1063/1.4952740

Citation

Krasnok, A, Glybovski, S, Petrov, M, Makarov, S, Savelev, R, Belov, P, Simovski, K & Kivshar, Y 2016, ' Demonstration of the enhanced Purcell factor in all-dielectric structures ', Applied Physics Letters, vol. 108, no. 21, 211105 . https://doi.org/10.1063/1.4952740

Permanent link to this item

https://urn.fi/URN:NBN:fi:aalto-201808014246

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[article-cris] Sähkötekniikan korkeakoulu / ELEC

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