Utilizing the near-field Scanner in RF Immunity EMC testing in medical devices
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Journal Title
Journal ISSN
Volume Title
Sähkötekniikan korkeakoulu |
Master's thesis
Ask about the availability of the thesis by sending email to the Aalto University Learning Centre oppimiskeskus@aalto.fi
Author
Date
2018-03-26
Department
Major/Subject
Translational Engineering
Mcode
ELEC3023
Degree programme
AEE - Master’s Programme in Automation and Electrical Engineering (TS2013)
Language
en
Pages
8+75
Series
Description
Supervisor
Sepponen, RaimoThesis advisor
Pasanen, MikkoKeywords
EMC, near field, far field, capacitive coupling, inductive coupling
