Indirect Off-Axis Holography for Antenna Metrology

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A3 Kirjan tai muun kokoomateoksen osa
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Date
2017
Major/Subject
Mcode
Degree programme
Language
en
Pages
243-269
Series
Holographic Materials and Optical Systems
Abstract
Phase acquisition in antenna measurement, especially at millimeter- and submillimeter-wave frequencies, is an expensive and challenging task. The need of a steady phase reference demands not only a very stable source but unvarying temperature conditions and strong positioning accuracy requirements. Indirect off-axis holography is an interferometric technique that allows for characterization of an unknown field by means of a simple filtering process of the hologram or intensity interference pattern in the spectral domain, provided that the reference field, employed to interfere with the unknown field, is known in amplitude and phase. This technique can be used to avoid the effect of the errors related to the phase acquisition and to further develop new efficient and robust techniques capable of phase retrieval from amplitude-only acquisitions allowing for cost and complexity reduction of the measurement setup. A short review of the state-of-the-art in antenna metrology is presented in this chapter, as well as a description of conventional indirect off-axis techniques applied to this field. Last sections are devoted to the description of novel measurement techniques developed by the authors in order to overcome the main limitations of the conventional methods.
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Keywords
antenna measurement, antenna diagnostics, amplitude-only, interferometry, off-axis holography, indirect holography, phaseless, microwave holography, millimeter-wave, submillimeter-wave
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Citation
Arboleya , A , Laviada , J , Ala-Laurinaho , J , Álvarez , Y , Las-Heras , F & Räisänen , A V 2017 , Indirect Off-Axis Holography for Antenna Metrology . in I Naydenova , D Nazarova & T Babeva (eds) , Holographic Materials and Optical Systems . InTech Open , Rijeka , pp. 243-269 . https://doi.org/10.5772/67294