Site-specific force-distance characteristics on NaCl(001): Measurements versus atomistic simulations

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Journal Title
Journal ISSN
Volume Title
School of Science | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
Date
2006
Major/Subject
Mcode
Degree programme
Language
en
Pages
245426/1-9
Series
Physical Review B, Volume 74, Issue 24
Abstract
A scanning force microscope was used to measure the frequency shift above various atomic sites on a NaCl(001) surface at 7K. The data was converted to force and compared to the results of atomistic simulations using model NaCl and MgO tips. We find that the NaCl tip demonstrates better agreement in the magnitude of the forces in experiments, supporting the observation that the tip first came into contact with the sample. Using the MgO tip as a model of the originally oxidized silicon tip, we further demonstrate a possible mechanism for tip contamination at low temperatures.
Description
Keywords
AFM, NaCl, experiments, theory
Other note
Citation
Lantz, M. A. & Hoffmann, R. & Foster, Adam S. & Baratoff, A. & Hug, H. J. & Hidber, H. R. & Güntherodt, H.-J. 2006. Site-specific force-distance characteristics on NaCl(001): Measurements versus atomistic simulations. Physical Review B. Volume 74, Issue 24. 245426/1-9. ISSN 1550-235X (electronic). DOI: 10.1103/physrevb.74.245426.