Conoscopic interferometry of wafers for surface-acoustic wave devices

Loading...
Thumbnail Image
Journal Title
Journal ISSN
Volume Title
School of Science | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
Date
1997
Major/Subject
Mcode
Degree programme
Language
en
Pages
4039-4042
Series
Journal of Applied Physics, Volume 82, Issue 8
Abstract
We show that in interpreting the conoscopic interference fringes, one should exercise care in employing approximate expressions which fail for certain crystal cuts. In this paper, we study 64°- and 128°-rotated Y-cut and Z-cut LiNbO3 wafers. We show that the error made in using the approximate formulae for the samples is more than 25% and that one has to use exact formulae in order to attain quantitative agreement with the experimental data.
Description
Keywords
SAW wafers, LiNbO3 wafer, surface-acoustic wave devices, conoscopic interferometry, orientation, crystals, crystal cuts
Other note
Citation
Äyräs, Pekka & Friberg, Ari T. & Kaivola, Matti & Salomaa, Martti M.. 1997. Conoscopic interferometry of wafers for surface-acoustic wave devices. Journal of Applied Physics. Volume 82, Issue 8. 4039-4042. ISSN 1089-7550 (electronic). ISSN 0021-8979 (printed). DOI: 10.1063/1.365755.