Role of copper in light induced minority-carrier lifetime degradation of silicon
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Journal Title
Journal ISSN
Volume Title
School of Electrical Engineering |
A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
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Date
2009
Major/Subject
Mcode
Degree programme
Language
en
Pages
3
Series
Applied Physics Letters, Vol. 95, Issue 15
Abstract
We investigate the impact of copper on the light induced minority-carrier lifetime degradation in various crystalline silicon materials. We demonstrate here that the presence of neither boron nor oxygen is necessary for the degradation effect. In addition, our experiments reveal that copper contamination alone can cause the light induced minority-carrier lifetime degradation.Description
Keywords
copper contamination, crystalline silicon materials, degradation effect, minority-carrier lifetime, solar cells, light-induced degradation, LID, boron, oxygen
Other note
Citation
Savin, Hele & Yli-Koski, Marko & Haarahiltunen, Antti. 2009. Role of copper in light induced minority-carrier lifetime degradation of silicon. Applied Physics Letters. Vol. 95, Issue 15. 0003-6951 (printed). 10.1063/1.3250161.
