A Practical Application of UPPAAL and DTRON for Runtime Verification

Dragos Truscan; Tanwir Ahmad; Faezeh Siavashi; Pekka Tuuttila

doi:10.1109/SERIP.2015.15

A Practical Application of UPPAAL and DTRON for Runtime Verification

Dragos Truscan, Tanwir Ahmad, Faezeh Siavashi, Pekka Tuuttila

Research output: Chapter in Book/Conference proceeding › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

16 Downloads (Pure)

Abstract

We present our experience in applying runtime verification to a real-time system using UPPAAL timed automata and a set of related tools. We discuss the benefits and limitations,and propose a concrete solution to address the latter. Using the resulting solution we are able to run quick validation cycles as well as more thorough ones depending on the scope of validation.Finally, we show that our solution was able to detect faults which were not detected by more traditional testing techniques.

Original language	Undefined/Unknown
Title of host publication	IEEE/ACM 2nd International Workshop on Software Engineering Research and Industrial Practice
Editors	Judith Bishop, Sagar Sen, Rakesh Shukla, Forrest Shull
Publisher	IEEE
Pages	39–45
ISBN (Print)	978-1-4673-7085-1
DOIs	https://doi.org/10.1109/SERIP.2015.15
Publication status	Published - 2015
MoE publication type	A4 Article in a conference publication
Event	International Workshop on Software Engineering Research and Industrial Practice (SER&IP) - 2nd International Workshop on Software Engineering Research and Industrial Practice (SER&IP) Duration: 17 May 2015 → 17 May 2015

Conference

Conference	International Workshop on Software Engineering Research and Industrial Practice (SER&IP)
Period	17/05/15 → 17/05/15

Access to Document

10.1109/SERIP.2015.15

pre-print_paper.pdf

N4S: Need for Speed
Porres Paltor, I., Nybom, K., Truscan, D., Ashraf, A., Troubitsyna, E., Byholm, B., Rauf, I. M. & Ahmad, T.
01/01/14 → 31/12/16
Project: Industry/Business Finland
PAM: Practical Applications of Model-based technologies to continuous integration & testing methodologies
Truscan, D., Ahmad, T., Iqbal, J., Porres Paltor, I. & Siavashi, F.
01/01/12 → 31/12/15
Project: Industry/Business Finland

Cite this

@inproceedings{d578a6b2496c4c37b61ca7d614b8cf21,

title = "A Practical Application of UPPAAL and DTRON for Runtime Verification",

abstract = "We present our experience in applying runtime verification to a real-time system using UPPAAL timed automata and a set of related tools. We discuss the benefits and limitations,and propose a concrete solution to address the latter. Using the resulting solution we are able to run quick validation cycles as well as more thorough ones depending on the scope of validation.Finally, we show that our solution was able to detect faults which were not detected by more traditional testing techniques.",

author = "Dragos Truscan and Tanwir Ahmad and Faezeh Siavashi and Pekka Tuuttila",

year = "2015",

doi = "10.1109/SERIP.2015.15",

language = "Odefinierat/ok{\"a}nt",

isbn = "978-1-4673-7085-1",

pages = "39–45",

editor = "Judith Bishop and Sagar Sen and Rakesh Shukla and Forrest Shull",

booktitle = "IEEE/ACM 2nd International Workshop on Software Engineering Research and Industrial Practice",

publisher = "IEEE",

note = "International Workshop on Software Engineering Research and Industrial Practice (SER&IP) ; Conference date: 17-05-2015 Through 17-05-2015",

}

Truscan, D , Ahmad, T, Siavashi, F & Tuuttila, P 2015, A Practical Application of UPPAAL and DTRON for Runtime Verification. in J Bishop, S Sen, R Shukla & F Shull (eds), IEEE/ACM 2nd International Workshop on Software Engineering Research and Industrial Practice. IEEE, pp. 39–45, International Workshop on Software Engineering Research and Industrial Practice (SER&IP), 17/05/15. https://doi.org/10.1109/SERIP.2015.15

A Practical Application of UPPAAL and DTRON for Runtime Verification. / Truscan, Dragos ; Ahmad, Tanwir; Siavashi, Faezeh et al.
IEEE/ACM 2nd International Workshop on Software Engineering Research and Industrial Practice. ed. / Judith Bishop; Sagar Sen; Rakesh Shukla; Forrest Shull. IEEE, 2015. p. 39–45.

Research output: Chapter in Book/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - A Practical Application of UPPAAL and DTRON for Runtime Verification

AU - Truscan, Dragos

AU - Ahmad, Tanwir

AU - Siavashi, Faezeh

AU - Tuuttila, Pekka

PY - 2015

Y1 - 2015

N2 - We present our experience in applying runtime verification to a real-time system using UPPAAL timed automata and a set of related tools. We discuss the benefits and limitations,and propose a concrete solution to address the latter. Using the resulting solution we are able to run quick validation cycles as well as more thorough ones depending on the scope of validation.Finally, we show that our solution was able to detect faults which were not detected by more traditional testing techniques.

AB - We present our experience in applying runtime verification to a real-time system using UPPAAL timed automata and a set of related tools. We discuss the benefits and limitations,and propose a concrete solution to address the latter. Using the resulting solution we are able to run quick validation cycles as well as more thorough ones depending on the scope of validation.Finally, we show that our solution was able to detect faults which were not detected by more traditional testing techniques.

U2 - 10.1109/SERIP.2015.15

DO - 10.1109/SERIP.2015.15

M3 - Konferensbidrag

SN - 978-1-4673-7085-1

SP - 39

EP - 45

BT - IEEE/ACM 2nd International Workshop on Software Engineering Research and Industrial Practice

A2 - Bishop, Judith

A2 - Sen, Sagar

A2 - Shukla, Rakesh

A2 - Shull, Forrest

PB - IEEE

T2 - International Workshop on Software Engineering Research and Industrial Practice (SER&IP)

Y2 - 17 May 2015 through 17 May 2015

ER -

A Practical Application of UPPAAL and DTRON for Runtime Verification

Abstract

Conference

Access to Document

Projects

N4S: Need for Speed

PAM: Practical Applications of Model-based technologies to continuous integration & testing methodologies

Cite this