Electric field measurements using scanning electron microscope
Boldin, Pavel (2010)
Diplomityö
Boldin, Pavel
2010
Julkaisun pysyvä osoite on
https://urn.fi/URN:NBN:fi-fe201006102005
https://urn.fi/URN:NBN:fi-fe201006102005
Tiivistelmä
The main idea of this diploma work is to study electric field distribution on the micro level. For this purpose a silicon edgeless detector was chosen as the object of investigation and scanning electron microscope as an investigation tool. Silicon edgeless detector is an important part of installation for studying proton-proton interactions in TOTEM experiment at Large Hadron Collider. For measurement of electric field distribution inside scanning electron microscope a voltage contrast method was applied.